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General solution for the complex frequency shift in microwave measurements of thin films
Physical review B: Condensed matter and materials physics, 64 (2001), 22; 224504-12. https://doi.org/10.1103/PhysRevB.64.224504
Peligrad, D.-N.; Nebendahl, B.; Mehring, M.; Dulčić, Antonije; Požek, Miroslav; Paar, Dalibor

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Peligrad, D. N., Nebendahl, B., Mehring, M., Dulčić, A., Požek, M. i Paar, D. (2001). General solution for the complex frequency shift in microwave measurements of thin films. Physical review B: Condensed matter and materials physics, 64. (22), 224504-12. doi: 10.1103/PhysRevB.64.224504

Peligrad, D. N., et al. "General solution for the complex frequency shift in microwave measurements of thin films." Physical review B: Condensed matter and materials physics, vol. 64, br. 22, 2001, str. 224504-12. https://doi.org/10.1103/PhysRevB.64.224504

Peligrad, D. N., B. Nebendahl, M. Mehring, Antonije Dulčić, Miroslav Požek i Dalibor Paar. "General solution for the complex frequency shift in microwave measurements of thin films." Physical review B: Condensed matter and materials physics 64, br. 22 (2001): 224504-12. https://doi.org/10.1103/PhysRevB.64.224504

Peligrad, D. N., et al. (2001) 'General solution for the complex frequency shift in microwave measurements of thin films', Physical review B: Condensed matter and materials physics, 64(22), str. 224504-12. doi: 10.1103/PhysRevB.64.224504

Peligrad DN, Nebendahl B, Mehring M, Dulčić A, Požek M, Paar D. General solution for the complex frequency shift in microwave measurements of thin films. Physical review B: Condensed matter and materials physics [Internet]. 2001. [pristupljeno 19.11.2024.];64(22):224504-12. doi: 10.1103/PhysRevB.64.224504

D. N. Peligrad, B. Nebendahl, M. Mehring, A. Dulčić, M. Požek i D. Paar, "General solution for the complex frequency shift in microwave measurements of thin films", Physical review B: Condensed matter and materials physics, vol. 64, br. 22, str. 224504-12, 2001. [Online]. Dostupno na: https://urn.nsk.hr/urn:nbn:hr:217:219108. [Citirano: 19.11.2024.]

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Podaci o radu
Naslov (engleski)General solution for the complex frequency shift in microwave measurements of thin films
AutorD.-N. Peligrad
AutorB. Nebendahl
AutorM. Mehring
AutorAntonije Dulčić
AutorMiroslav Požek
AutorDalibor Paar
Autorova ustanovaSveučilište u Zagrebu
Prirodoslovno-matematički fakultet
(Fizički odsjek)
Znanstveno / umjetničko
područje, polje i grana		PRIRODNE ZNANOSTI
Fizika
Sažetak (engleski)
Perturbation of a microwave cavity by a small sample with variable dielectric, magnetic, or conducting properties is considered. The complex frequency shift is derived in terms of a volume integral, or equivalently, in terms of a surface integral. These are used to obtain a general formula for thin films in the microwave electric field maximum. The complex frequency shift depends on the depolarization factor of the film and on its thickness in a nontrivial way. The previously known expressions for the complex frequency shift are shown to be good approximations of the present solution in the low and high conductivity limits. Our formula is applied to calculate the signal shapes in superconducting films of various geometric parameters and conductivities. It is shown that a diversity of signal shapes can result, and experimental support of those shapes is provided. The role of the dielectric substrate on which the thin film is grown is simply reduced to an asymmetry effect.
Ključne riječi (engleski)
Jezikengleski
Vrsta publikacijeZnanstveni rad - Izvorni znanstveni rad
Status objaveObjavljen
Vrsta recenzijeRecenziran - međunarodna recenzija
Verzija publikacijeObjavljena verzija rada (izdavačev PDF)
Naslov časopisaPhysical review B: Condensed matter and materials physics
Brojčani podacivol. 64, br. 22, str. 224504-12
p-ISSN1098-0121
e-ISSN1550-235X
DOIhttps://doi.org/10.1103/PhysRevB.64.224504
URN:NBNurn:nbn:hr:217:219108
Datum objave publikacije2001
URL dokumentahttp://link.aps.org/doi/10.1103/PhysRevB.64.224504
Vrsta resursaTekst
Prava pristupaOtvoreni pristup
Uvjeti korištenjaIkona licence Zaštićeno autorskim pravom.
Javna napomenaCopyright (2001) by the American Physical Society.
Datum i vrijeme pohrane2019-10-11 15:31:31