Đerđ, I., Tonejc, A., Tonejc, A. & Radić, N. (2006). On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A, 15. (1), 35-50. Retrieved from https://urn.nsk.hr/urn:nbn:hr:217:428918
Đerđ, Igor, et al. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A, vol. 15, no. 1, 2006, pp. 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918
Đerđ, Igor, Anđelka Tonejc, Antun Tonejc and Nikola Radić. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A 15, no. 1 (2006): 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918
Đerđ, I., et al. (2006) 'On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films', Fizika A, 15(1), pp. 35-50. Available at: https://urn.nsk.hr/urn:nbn:hr:217:428918 (Accessed 02 October 2024)
Đerđ I, Tonejc A, Tonejc A, Radić N. On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A [Internet]. 2006 [cited 2024 October 02];15(1):35-50. Available at: https://urn.nsk.hr/urn:nbn:hr:217:428918
I. Đerđ, A. Tonejc, A. Tonejc and N. Radić, "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films", Fizika A, vol. 15, no. 1, pp. 35-50, 2006. [Online]. Available at: https://urn.nsk.hr/urn:nbn:hr:217:428918. [Accessed: 02 October 2024]