Znanstveni rad - Izvorni znanstveni rad
On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films

Đerđ, Igor; Tonejc, Anđelka; Tonejc, Antun; Radić, Nikola (2006)
Citirajte ovaj rad

Đerđ, I., Tonejc, A., Tonejc, A. i Radić, N. (2006). On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A, 15. (1), 35-50. Preuzeto s https://urn.nsk.hr/urn:nbn:hr:217:428918

Đerđ, Igor, et al. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A, vol. 15, br. 1, 2006, str. 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918

Đerđ, Igor, Anđelka Tonejc, Antun Tonejc i Nikola Radić. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A 15, br. 1 (2006): 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918

Đerđ, I., et al. (2006) 'On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films', Fizika A, 15(1), str. 35-50. Preuzeto s: https://urn.nsk.hr/urn:nbn:hr:217:428918 (Datum pristupa: 24.01.2020.)

Đerđ I, Tonejc A, Tonejc A, Radić N. On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A [Internet]. 2006. [pristupljeno 24.01.2020.];15(1):35-50. Dostupno na: https://urn.nsk.hr/urn:nbn:hr:217:428918

I. Đerđ, A. Tonejc, A. Tonejc i N. Radić, "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films", Fizika A, vol. 15, br. 1, str. 35-50, 2006. [Online]. Dostupno na: https://urn.nsk.hr/urn:nbn:hr:217:428918. [Citirano: 24.01.2020.]

Prijavite se u repozitorij kako biste mogli spremiti objekt u svoju listu.