prikaz prve stranice dokumenta On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films
  Preuzmi
PDF 846.84 KB
Znanstveni rad - Izvorni znanstveni rad
On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films
Fizika A, 15 (2006), 1; 35-50. urn:nbn:hr:217:428918
Đerđ, Igor; Tonejc, Anđelka; Tonejc, Antun; Radić, Nikola

Citirajte ovaj rad

Đerđ, I., Tonejc, A., Tonejc, A. i Radić, N. (2006). On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A, 15. (1), 35-50. Preuzeto s https://urn.nsk.hr/urn:nbn:hr:217:428918

Đerđ, Igor, et al. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A, vol. 15, br. 1, 2006, str. 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918

Đerđ, Igor, Anđelka Tonejc, Antun Tonejc i Nikola Radić. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A 15, br. 1 (2006): 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918

Đerđ, I., et al. (2006) 'On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films', Fizika A, 15(1), str. 35-50. Preuzeto s: https://urn.nsk.hr/urn:nbn:hr:217:428918 (Datum pristupa: 16.11.2024.)

Đerđ I, Tonejc A, Tonejc A, Radić N. On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A [Internet]. 2006. [pristupljeno 16.11.2024.];15(1):35-50. Dostupno na: https://urn.nsk.hr/urn:nbn:hr:217:428918

I. Đerđ, A. Tonejc, A. Tonejc i N. Radić, "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films", Fizika A, vol. 15, br. 1, str. 35-50, 2006. [Online]. Dostupno na: https://urn.nsk.hr/urn:nbn:hr:217:428918. [Citirano: 16.11.2024.]

Za citiranje koristite ovu mrežnu adresu: https://urn.nsk.hr/urn:nbn:hr:217:428918
Prijavite se u repozitorij kako biste mogli spremiti objekt u svoju listu.
Podaci o radu
Naslov (engleski)On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films
AutorIgor Đerđ
AutorAnđelka Tonejc
AutorAntun Tonejc
AutorNikola Radić
Autorova ustanovaSveučilište u Zagrebu
Prirodoslovno-matematički fakultet
(Fizički odsjek)
Znanstveno / umjetničko
područje, polje i grana		PRIRODNE ZNANOSTI
Fizika
Sažetak (engleski)
Different methods of X-ray diffraction line profile analysis (XRDLPA) are used to study microstructural parameters such as crystallite size (diffracted domain size), microstrain and texture in tungsten thin films deposited on glass by DC magnetron sputtering at different substrate temperatures and at different working-gas pressures. The whole-pattern analysis within the Rietveld method, the "single-line" method and "double Voigt" method (equivalent to the Warren-Averbach method) are applied and mutually compared. In addition, the results obtained by the Scherrer method are also discussed. The line broadening has been found to be isotropic, supporting the reliability of usage of the Rietveld method in the size-microstrain extraction.
Ključne riječi (engleski)
Jezikengleski
Vrsta publikacijeZnanstveni rad - Izvorni znanstveni rad
Status objaveObjavljen
Vrsta recenzijeRecenziran
Verzija publikacijeObjavljena verzija rada (izdavačev PDF)
Naslov časopisaFizika A
Brojčani podacivol. 15, br. 1, str. 35-50
p-ISSN1330-0008
URN:NBNurn:nbn:hr:217:428918
Datum objave publikacije2006
URL dokumentahttp://fizika.hfd.hr/fizika_a/av06/a15p035.htm
Vrsta resursaTekst
Prava pristupaOtvoreni pristup
Uvjeti korištenjaIkona licence Zaštićeno autorskim pravom.
Datum i vrijeme pohrane2019-10-15 15:53:13