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Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions
Physical review B: Condensed matter and materials physics, 55 (1997), 3; 1741-1747. urn:nbn:hr:217:930128


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Šestović, D., Marušić, L. i Šunjić, M. (1997). Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions. Physical review B: Condensed matter and materials physics, 55. (3), 1741-1747. Preuzeto s https://urn.nsk.hr/urn:nbn:hr:217:930128

Šestović, Dragan, et al. "Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions." Physical review B: Condensed matter and materials physics, vol. 55, br. 3, 1997, str. 1741-1747. https://urn.nsk.hr/urn:nbn:hr:217:930128

Šestović, Dragan, Leonardo Marušić i Marijan Šunjić. "Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions." Physical review B: Condensed matter and materials physics 55, br. 3 (1997): 1741-1747. https://urn.nsk.hr/urn:nbn:hr:217:930128

Šestović, D., Marušić, L. i Šunjić, M. (1997) 'Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions', Physical review B: Condensed matter and materials physics, 55(3), str. 1741-1747. Preuzeto s: https://urn.nsk.hr/urn:nbn:hr:217:930128 (Datum pristupa: 17.01.2021.)

Šestović D, Marušić L, Šunjić M. Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions. Physical review B: Condensed matter and materials physics [Internet]. 1997. [pristupljeno 17.01.2021.];55(3):1741-1747. Dostupno na: https://urn.nsk.hr/urn:nbn:hr:217:930128

D. Šestović, L. Marušić i M. Šunjić, "Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions", Physical review B: Condensed matter and materials physics, vol. 55, br. 3, str. 1741-1747, 1997. [Online]. Dostupno na: https://urn.nsk.hr/urn:nbn:hr:217:930128. [Citirano: 17.01.2021.]

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