Đerđ, I., Tonejc, A., Tonejc, A. i Radić, N. (2006). On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A, 15. (1), 35-50. Preuzeto s https://urn.nsk.hr/urn:nbn:hr:217:428918
Đerđ, Igor, et al. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A, vol. 15, br. 1, 2006, str. 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918
Đerđ, Igor, Anđelka Tonejc, Antun Tonejc i Nikola Radić. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A 15, br. 1 (2006): 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918
Đerđ, I., et al. (2006) 'On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films', Fizika A, 15(1), str. 35-50. Preuzeto s: https://urn.nsk.hr/urn:nbn:hr:217:428918 (Datum pristupa: 21.08.2024.)
Đerđ I, Tonejc A, Tonejc A, Radić N. On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A [Internet]. 2006. [pristupljeno 21.08.2024.];15(1):35-50. Dostupno na: https://urn.nsk.hr/urn:nbn:hr:217:428918
I. Đerđ, A. Tonejc, A. Tonejc i N. Radić, "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films", Fizika A, vol. 15, br. 1, str. 35-50, 2006. [Online]. Dostupno na: https://urn.nsk.hr/urn:nbn:hr:217:428918. [Citirano: 21.08.2024.]