prikaz prve stranice dokumenta New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles
  Preuzmi
PDF 289.92 KB
Znanstveni rad - Izvorni znanstveni rad
New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles
Acta Chimica Slovenica, 63 (2016), 4; 874-880. https://doi.org/10.17344/acsi.2016.2837
Dekanić, Krešimir; Skoko, Željko; Lončarić, Sven

Citirajte ovaj rad

Dekanić, K., Skoko, Ž. i Lončarić, S. (2016). New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles. Acta Chimica Slovenica, 63. (4), 874-880. doi: 10.17344/acsi.2016.2837

Dekanić, Krešimir, et al. "New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles." Acta Chimica Slovenica, vol. 63, br. 4, 2016, str. 874-880. https://doi.org/10.17344/acsi.2016.2837

Dekanić, Krešimir, Željko Skoko i Sven Lončarić. "New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles." Acta Chimica Slovenica 63, br. 4 (2016): 874-880. https://doi.org/10.17344/acsi.2016.2837

Dekanić, K., Skoko, Ž. i Lončarić, S. (2016) 'New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles', Acta Chimica Slovenica, 63(4), str. 874-880. doi: 10.17344/acsi.2016.2837

Dekanić K, Skoko Ž, Lončarić S. New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles. Acta Chimica Slovenica [Internet]. 2016. [pristupljeno 14.11.2024.];63(4):874-880. doi: 10.17344/acsi.2016.2837

K. Dekanić, Ž. Skoko i S. Lončarić, "New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles", Acta Chimica Slovenica, vol. 63, br. 4, str. 874-880, 2016. [Online]. Dostupno na: https://urn.nsk.hr/urn:nbn:hr:217:618587. [Citirano: 14.11.2024.]

Za citiranje koristite ovu mrežnu adresu: https://urn.nsk.hr/urn:nbn:hr:217:618587
Prijavite se u repozitorij kako biste mogli spremiti objekt u svoju listu.
Podaci o radu
Naslov (engleski)New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles
AutorKrešimir Dekanić
AutorŽeljko Skoko
AutorSven Lončarić
Autorova ustanovaSveučilište u Zagrebu
Prirodoslovno-matematički fakultet
Znanstveno / umjetničko
područje, polje i grana		PRIRODNE ZNANOSTI
Fizika
Znanstveno / umjetničko
područje, polje i grana		PRIRODNE ZNANOSTI
Kemija
Znanstveno / umjetničko
područje, polje i grana		TEHNIČKE ZNANOSTI
Računarstvo
Sažetak (engleski)
Knowledge about the microstructure is crucial in targeted synthesis of novel nanomaterials. The microstructural para- meters, crystallite size and crystallite strain play a major role in physical and chemical properties of the material. X-ray diffraction (XRD) is a very suitable method for this task, since it is non-destructive and it enables a very quick and pre- cise determination of these parameters. The main problem lies in the case where the two neighboring diffraction profi- les overlap each other. Here we present a new method for the separation of the overlapping profiles based on the diffe- rentiation of the profiles. Further, this method is appropriate for non- crystallographers working in the field of material science since it does not require any crystallographic experience and the full knowledge about the structure of the sam- ple investigated. The microstructural results obtained by the proposed method are very accurate.
Ključne riječi (engleski)
Jezikengleski
Vrsta publikacijeZnanstveni rad - Izvorni znanstveni rad
Status objaveObjavljen
Vrsta recenzijeRecenziran - međunarodna recenzija
Verzija publikacijeObjavljena verzija rada (izdavačev PDF)
Naslov časopisaActa Chimica Slovenica
Brojčani podacivol. 63, br. 4, str. 874-880
p-ISSN1580-3155
DOIhttps://doi.org/10.17344/acsi.2016.2837
URN:NBNurn:nbn:hr:217:618587
Datum objave publikacije2016
URL dokumentahttps://journals.matheo.si/index.php/ACSi/article/view/2837
Vrsta resursaTekst
Prava pristupaOtvoreni pristup
Uvjeti korištenjaIkona licence Imenovanje 4.0 međunarodna (CC BY 4.0)
Datum i vrijeme pohrane2020-02-07 16:44:11